Matches in Library of Congress for { <http://lccn.loc.gov/2006285152> ?p ?o. }
Showing items 1 to 25 of
25
with 100 items per page.
- 2006285152 alternative "MTDT '06".
- 2006285152 alternative "Proceedings of the IEEE Workshop on Memory Technology, Design, and Testing".
- 2006285152 contributor B10490226.
- 2006285152 contributor B10490227.
- 2006285152 created "c2006.".
- 2006285152 date "2006".
- 2006285152 date "c2006.".
- 2006285152 dateCopyrighted "c2006.".
- 2006285152 description "Includes bibliographical references and index.".
- 2006285152 extent "xviii, 83 p. :".
- 2006285152 identifier "0769525725 (pbk.)".
- 2006285152 identifier "9780769525723 (pbk.)".
- 2006285152 identifier 2006285152.html.
- 2006285152 issued "2006".
- 2006285152 issued "c2006.".
- 2006285152 language "eng".
- 2006285152 publisher "Los Alamitos, Calif. : IEEE Computer Society,".
- 2006285152 subject "621.39/732 22".
- 2006285152 subject "Random access memory Congresses.".
- 2006285152 subject "Semiconductor storage devices Testing Congresses.".
- 2006285152 subject "TK7895.M4 I334 2006".
- 2006285152 title "2006 IEEE International Workshop on Memory Technology, Design, and Testing : 2-4 August 2006, Taipei, Taiwan : proceedings / sponsored by IEEE Computer Society, Technical Council on Testing Technology (TTTC), Technical Committee on VLSI : co-sponsored by National Tsing-Hus University, Taiwan, Ministry of Education, Taiwan : in-cooperation with IEEE Circuits and Systems Society, IEEE Solid-State Circuits Society.".
- 2006285152 title "MTDT '06".
- 2006285152 title "Proceedings of the IEEE Workshop on Memory Technology, Design, and Testing".
- 2006285152 type "text".