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- 2006286983 alternative "Trends in semiconductor technology and ESD testing".
- 2006286983 alternative "White paper 2".
- 2006286983 alternative "White paper II, trends in semiconductor technology and electrostatic discharge testing".
- 2006286983 contributor B10492505.
- 2006286983 created "c2006.".
- 2006286983 date "2006".
- 2006286983 date "c2006.".
- 2006286983 dateCopyrighted "c2006.".
- 2006286983 description "Includes bibliographical references.".
- 2006286983 extent "iii, 58 p. :".
- 2006286983 identifier "1585371165 (pbk.)".
- 2006286983 issued "2006".
- 2006286983 issued "c2006.".
- 2006286983 language "eng".
- 2006286983 publisher "Rome, NY : ESD Association,".
- 2006286983 subject "621.3815/2 22".
- 2006286983 subject "Electric discharges Prevention.".
- 2006286983 subject "Electrostatics.".
- 2006286983 subject "Integrated circuits Design and construction.".
- 2006286983 subject "Semiconductors Testing.".
- 2006286983 subject "TK7871.85 .W498 2001".
- 2006286983 title "Trends in semiconductor technology and ESD testing".
- 2006286983 title "White paper 2".
- 2006286983 title "White paper II : trends in semiconductor technology and ESD testing / ESD Association.".
- 2006286983 title "White paper II, trends in semiconductor technology and electrostatic discharge testing".
- 2006286983 type "text".