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- 2006286985 alternative "Electronic imaging science and technology".
- 2006286985 contributor B10492508.
- 2006286985 contributor B10492509.
- 2006286985 created "c2006.".
- 2006286985 date "2006".
- 2006286985 date "c2006.".
- 2006286985 dateCopyrighted "c2006.".
- 2006286985 description "Includes bibliographical references and author index.".
- 2006286985 extent "1 v. (various pagings) :".
- 2006286985 identifier "0819461105 (pbk.)".
- 2006286985 identifier 2006286985.html.
- 2006286985 isPartOf "Proceedings of SPIE--the International Society for Optical Engineering ; v. 6070.".
- 2006286985 isPartOf "SPIE ; vol. 6070".
- 2006286985 issued "2006".
- 2006286985 issued "c2006.".
- 2006286985 language "eng".
- 2006286985 publisher "Bellingham, Wash. : SPIE ; Springfield, Va. : IS&T,".
- 2006286985 subject "670.42/5 22".
- 2006286985 subject "Computer vision Industrial applications Congresses.".
- 2006286985 subject "Engineering inspection Automation Congresses.".
- 2006286985 subject "Measurement Congresses.".
- 2006286985 subject "Quality control Optical methods Automation Congresses.".
- 2006286985 subject "TS156.2 .M32584 2006".
- 2006286985 title "Electronic imaging science and technology".
- 2006286985 title "Machine vision applications in industrial inspection XIV : 16-17 January, 2006, San Jose, California, USA / Fabrice Meriaudeau, Kurt S. Niel, chairs/editors ; sponsored by IS&T--the Society for Imaging Science and Technology [and] SPIE--the International Society for Optical Engineering.".
- 2006286985 type "text".