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- 2006482582 contributor B10669977.
- 2006482582 contributor B10669978.
- 2006482582 created "c2006.".
- 2006482582 date "2006".
- 2006482582 date "c2006.".
- 2006482582 dateCopyrighted "c2006.".
- 2006482582 description "Includes bibliographical references and index.".
- 2006482582 extent "xxii, 356 p. :".
- 2006482582 identifier "3527310525".
- 2006482582 identifier "9783527310524".
- 2006482582 identifier 2006482582-b.html.
- 2006482582 identifier 2006482582-d.html.
- 2006482582 identifier 2006482582-t.html.
- 2006482582 issued "2006".
- 2006482582 issued "c2006.".
- 2006482582 language "eng".
- 2006482582 publisher "Weinheim : Wiley-VCH,".
- 2006482582 subject "530.4275 22".
- 2006482582 subject "QC176.83 .B57 2006".
- 2006482582 subject "Thin films.".
- 2006482582 subject "X-ray spectroscopy.".
- 2006482582 title "Thin film analysis by X-ray scattering / Mario Birkholz with contributions by Paul F. Fewster, Christoph Genzel.".
- 2006482582 type "text".