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- 2006530687 contributor B10699332.
- 2006530687 contributor B10699333.
- 2006530687 created "c2005.".
- 2006530687 date "2005".
- 2006530687 date "c2005.".
- 2006530687 dateCopyrighted "c2005.".
- 2006530687 description "Includes bibliographical references and author index.".
- 2006530687 extent "xxxiii, 260 p. :".
- 2006530687 identifier "0819457353 (pbk.)".
- 2006530687 isPartOf "Proceedings of SPIE ; v. 5755".
- 2006530687 isPartOf "Proceedings of SPIE--the International Society for Optical Engineering ; v. 5755.".
- 2006530687 issued "2005".
- 2006530687 issued "c2005.".
- 2006530687 language "eng".
- 2006530687 publisher "Bellingham, Wash. : SPIE,".
- 2006530687 subject "629.8/95 22".
- 2006530687 subject "Intelligent control systems Mathematical models Congresses.".
- 2006530687 subject "Manufacturing processes Automatic control Congresses.".
- 2006530687 subject "Manufacturing processes Mathematical models Congresses.".
- 2006530687 subject "Process control Mathematical models Congresses.".
- 2006530687 subject "TS183 .D37 2005".
- 2006530687 title "Data analysis and modeling for process control II : 3-4 March, 2005, San Jose, California, USA / Iraj Emami, chair/editor ; Christopher P. Ausschnitt, Kenneth W. Tobin, Jr., cochair/editors ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organization, International SEMATECH ; published by SPIE--the International Society for Optical Engineering.".
- 2006530687 type "text".