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- 2006923691 contributor B10735982.
- 2006923691 created "c2006.".
- 2006923691 date "2006".
- 2006923691 date "c2006.".
- 2006923691 dateCopyrighted "c2006.".
- 2006923691 description "Includes bibliographical references and index.".
- 2006923691 extent "xii, 292 p. :".
- 2006923691 identifier "3540284052 (hd.bd.)".
- 2006923691 identifier "9783540284055".
- 2006923691 identifier 2006923691-d.html.
- 2006923691 identifier 2006923691-t.html.
- 2006923691 isPartOf "Nanoscience and technology, 1434-4904".
- 2006923691 issued "2006".
- 2006923691 issued "c2006.".
- 2006923691 language "eng".
- 2006923691 publisher "Berlin ; New York : Springer-Verlag,".
- 2006923691 subject "502.82 22".
- 2006923691 subject "Atomic force microscopy.".
- 2006923691 subject "Near-field microscopy.".
- 2006923691 subject "QH212.A78 K38 2006".
- 2006923691 title "Atomic force microscopy, scanning nearfield optical microscopy and nanoscratching : application to rough and natural surfaces / G. Kaupp.".
- 2006923691 type "text".