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- 2007023373 contributor B10776785.
- 2007023373 created "c2008.".
- 2007023373 date "2008".
- 2007023373 date "c2008.".
- 2007023373 dateCopyrighted "c2008.".
- 2007023373 description "Includes bibliographical references and index.".
- 2007023373 extent "xxxvi, 856 p. :".
- 2007023373 identifier "012373973X (hardcover : alk. paper)".
- 2007023373 identifier "9780123739735 (hardcover : alk. paper)".
- 2007023373 identifier 2007023373-d.html.
- 2007023373 identifier 2007023373.html.
- 2007023373 isPartOf "The Morgan Kaufmann series in systems on silicon".
- 2007023373 issued "2008".
- 2007023373 issued "c2008.".
- 2007023373 language "eng".
- 2007023373 publisher "Amsterdam ; Boston : Morgan Kaufmann Publishers,".
- 2007023373 subject "621.39/5 22".
- 2007023373 subject "Integrated circuits Very large scale integration Design.".
- 2007023373 subject "Integrated circuits Very large scale integration Testing.".
- 2007023373 subject "Systems on a chip Testing.".
- 2007023373 subject "TK7895.E42 S978 2008".
- 2007023373 title "System-on-chip test architectures : nanometer design for testability / edited by Laung-Terng Wang, Charles E. Stroud, Nur A. Touba.".
- 2007023373 type "text".