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- 2007041704 contributor B10799021.
- 2007041704 contributor B10799022.
- 2007041704 created "c2008.".
- 2007041704 date "2008".
- 2007041704 date "c2008.".
- 2007041704 dateCopyrighted "c2008.".
- 2007041704 description "Includes bibliographical references and index.".
- 2007041704 extent "xiv, 536 p. :".
- 2007041704 identifier "9780470027844 (cloth)".
- 2007041704 identifier 2007041704-d.html.
- 2007041704 identifier 2007041704-t.html.
- 2007041704 isPartOf "Quantitative software engineering series".
- 2007041704 issued "2008".
- 2007041704 issued "c2008.".
- 2007041704 language "eng".
- 2007041704 publisher "Chichester, England : John Wiley & Sons,".
- 2007041704 subject "620.1/1299 22".
- 2007041704 subject "Materials Microscopy.".
- 2007041704 subject "Microstructure.".
- 2007041704 subject "TA417.23 .B73 2008".
- 2007041704 title "Microstructural characterization of materials / David Brandon and Wayne Kaplan.".
- 2007041704 type "text".