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- 2007271603 contributor B10815886.
- 2007271603 created "2006.".
- 2007271603 date "2006".
- 2007271603 date "2006.".
- 2007271603 dateCopyrighted "2006.".
- 2007271603 description "Includes bibliographical references.".
- 2007271603 extent "xii, 391 p. :".
- 2007271603 identifier "0521031702 (pbk.)".
- 2007271603 identifier "9780521031707 (pbk.)".
- 2007271603 identifier 2007271603-d.html.
- 2007271603 identifier 2007271603-t.html.
- 2007271603 issued "2006".
- 2007271603 issued "2006.".
- 2007271603 language "eng".
- 2007271603 publisher "Cambridge ; New York : Cambridge University Press,".
- 2007271603 subject "537.6/230284 22".
- 2007271603 subject "Electron microscopy Technique.".
- 2007271603 subject "High temperature superconductors.".
- 2007271603 subject "QC611.98.H54 C43 2006".
- 2007271603 title "Characterization of high Tc materials and devices by electron microscopy / edited by Nigel D. Browning, Stephen J. Pennycook.".
- 2007271603 type "text".