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- 2007272451 contributor B10816948.
- 2007272451 contributor B10816949.
- 2007272451 created "c2007.".
- 2007272451 date "2007".
- 2007272451 date "c2007.".
- 2007272451 dateCopyrighted "c2007.".
- 2007272451 description "Includes bibliographical references and index.".
- 2007272451 extent "xx, 301 p. :".
- 2007272451 identifier "158053709X".
- 2007272451 identifier "9781580537094".
- 2007272451 isPartOf "Artech House microwave library".
- 2007272451 issued "2007".
- 2007272451 issued "c2007.".
- 2007272451 language "eng".
- 2007272451 publisher "Boston : Artech House,".
- 2007272451 subject "621.3815 22".
- 2007272451 subject "Systems on a chip Testing.".
- 2007272451 subject "TK7895.E42 K45 2007".
- 2007272451 title "Advanced production testing of RF, SoC, and SiP devices / Joe Kelly, Michael Engelhardt.".
- 2007272451 type "text".