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- 2007273895 contributor B10818737.
- 2007273895 contributor B10818738.
- 2007273895 created "c2006.".
- 2007273895 date "2006".
- 2007273895 date "c2006.".
- 2007273895 dateCopyrighted "c2006.".
- 2007273895 description "Includes bibliographical references and author index.".
- 2007273895 extent "1 v. (various pagings) :".
- 2007273895 identifier "0819464805".
- 2007273895 identifier "9780819464804".
- 2007273895 isPartOf "Proceedings of SPIE, 0277-786X ; v. 6382".
- 2007273895 isPartOf "Proceedings of SPIE--the International Society for Optical Engineering ; v. 6382.".
- 2007273895 issued "2006".
- 2007273895 issued "c2006.".
- 2007273895 language "eng".
- 2007273895 publisher "Bellingham, Wash. : SPIE,".
- 2007273895 subject "681/.25 22".
- 2007273895 subject "Computer vision Congresses.".
- 2007273895 subject "Imaging systems Congresses.".
- 2007273895 subject "Metrology Congresses.".
- 2007273895 subject "Optical measurements Congresses.".
- 2007273895 subject "Quality control Optical methods Congresses.".
- 2007273895 subject "TA1634 .T89 2006".
- 2007273895 subject "Three-dimensional display systems Congresses.".
- 2007273895 title "Two- and three-dimensional methods for inspection and metrology IV : 1-3 October, 2006, Boston, Massachusetts, USA / Peisen S. Huang, chair/editor ; sponsored and published by by SPIE--the International Society for Optical Engineering.".
- 2007273895 type "text".