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- 2007275204 contributor B10820317.
- 2007275204 contributor B10820318.
- 2007275204 created "c2006.".
- 2007275204 date "2006".
- 2007275204 date "c2006.".
- 2007275204 dateCopyrighted "c2006.".
- 2007275204 description "Includes bibliographical references and index.".
- 2007275204 extent "2 v. (xiv, 1098 p.) :".
- 2007275204 identifier "1424402913 (set)".
- 2007275204 issued "2006".
- 2007275204 issued "c2006.".
- 2007275204 language "eng".
- 2007275204 publisher "Piscataway, NJ : Institute of Electrical and Electronics Engineers (IEEE),".
- 2007275204 subject "621.3815/48 22".
- 2007275204 subject "Electronic digital computers Circuits Testing Congresses.".
- 2007275204 subject "Integrated circuits Testing Congresses.".
- 2007275204 subject "Radio frequency Congresses.".
- 2007275204 subject "TK7874 .I593 2006".
- 2007275204 subject "Telecommunication Congresses.".
- 2007275204 title "2006 IEEE International Test Conference : Santa Clara, CA : 22-27 October 2006.".
- 2007275204 type "text".