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- 2007278737 contributor B10824707.
- 2007278737 contributor B10824708.
- 2007278737 contributor B10824709.
- 2007278737 created "c2006.".
- 2007278737 date "2006".
- 2007278737 date "c2006.".
- 2007278737 dateCopyrighted "c2006.".
- 2007278737 description "Includes bibliographical references and author index.".
- 2007278737 extent "2 v. :".
- 2007278737 identifier "081946189X".
- 2007278737 identifier "9780819461896".
- 2007278737 isPartOf "Proceedings of SPIE--the International Society for Optical Engineering ; v. 6150.".
- 2007278737 isPartOf "SPIE proceedings series ; v. 6150".
- 2007278737 issued "2006".
- 2007278737 issued "c2006.".
- 2007278737 language "eng".
- 2007278737 publisher "Bellingham, Wash. : SPIE,".
- 2007278737 subject "621.36 22".
- 2007278737 subject "Measurement Congresses.".
- 2007278737 subject "Optical materials Testing Congresses.".
- 2007278737 subject "Optical measurements Congresses.".
- 2007278737 subject "QC374 .I59 2005".
- 2007278737 title "Optical test and measurement technology and equipment : 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies : 2-5 November, 2005, Xian, China / Xun Hou ... [et al.], chairs/editors ; sponsored by COS--Chinese Optical Society (China) [and] IOE--the Institute of Optics and Electronics, CAS (China) ; cooperating organizations, Committee of Optical Manufacturing Technology, COS (China) ... [et al.] ; supporting organization, National Natural Science Foundation (China) ; technical cosponsor & published by SPIE--the International Society for Optical Engineering.".
- 2007278737 type "text".