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- 2007297867 alternative "15th Asian Test Symposium".
- 2007297867 alternative "ATS '06".
- 2007297867 alternative "Asian Test Symposium".
- 2007297867 contributor B10832998.
- 2007297867 contributor B10832999.
- 2007297867 created "c2006.".
- 2007297867 date "2006".
- 2007297867 date "c2006.".
- 2007297867 dateCopyrighted "c2006.".
- 2007297867 description "Includes bibliographical references and author index.".
- 2007297867 extent "xxiii, 451 p. :".
- 2007297867 identifier "0769522351".
- 2007297867 identifier "0769526284".
- 2007297867 identifier "9780769522357".
- 2007297867 identifier "9780769526287".
- 2007297867 issued "2006".
- 2007297867 issued "c2006.".
- 2007297867 language "eng".
- 2007297867 publisher "Los Alamitos, Calif. : IEEE Computer Society,".
- 2007297867 subject "621.3815/48 22".
- 2007297867 subject "Electronic circuits Testing Congresses.".
- 2007297867 subject "Electronic digital computers Circuits Testing Congresses.".
- 2007297867 subject "Fault-tolerant computing Congresses.".
- 2007297867 subject "TK7888.4 .A83 2006".
- 2007297867 title "15th Asian Test Symposium".
- 2007297867 title "ATS '06".
- 2007297867 title "Asian Test Symposium".
- 2007297867 title "Proceedings of the 15th Asian Test Symposium : 20-23 November 2006, Fukuoka, Japan / sponsored by IEEE Computer Society Test Technology Council (TTTC).".
- 2007297867 type "text".