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- 2007298033 contributor B10833213.
- 2007298033 contributor B10833214.
- 2007298033 created "c2007.".
- 2007298033 date "2007".
- 2007298033 date "c2007.".
- 2007298033 dateCopyrighted "c2007.".
- 2007298033 description "Includes bibliographical references and author index.".
- 2007298033 extent "xvi, 217 p. :".
- 2007298033 identifier "0769528279".
- 2007298033 identifier "9780769528274".
- 2007298033 identifier opac?punumber=7996.
- 2007298033 identifier 2007298033.html.
- 2007298033 issued "2007".
- 2007298033 issued "c2007.".
- 2007298033 language "eng".
- 2007298033 publisher "Los Alamitos, Calif. : IEEE Computer Society Press,".
- 2007298033 subject "621.3815 22".
- 2007298033 subject "Integrated circuits Testing Congresses.".
- 2007298033 subject "TK7874 .E7957 2007".
- 2007298033 title "ETS 2007 : 12th IEEE European Test Symposium : proceedings : 20-24 May, 2007, Freiburg, Germany / [sponsored by] IEEE Computer Society.".
- 2007298033 type "text".