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- 2007299156 contributor B10834550.
- 2007299156 contributor B10834551.
- 2007299156 created "c2007.".
- 2007299156 date "2007".
- 2007299156 date "c2007.".
- 2007299156 dateCopyrighted "c2007.".
- 2007299156 description "Includes bibliographical references and author index.".
- 2007299156 extent "1 v. (various pagings) :".
- 2007299156 identifier "0819466166".
- 2007299156 identifier "9780819466167".
- 2007299156 isPartOf "Electronic Imaging Science and Technology Symposium. Proceedings of Electronic Imaging Science and Technology.".
- 2007299156 isPartOf "Proceedings of Electronic Imaging Science and Technology.".
- 2007299156 isPartOf "Proceedings of SPIE, 0277-786X ; v. 6503".
- 2007299156 isPartOf "Proceedings of SPIE--the International Society for Optical Engineering ; v. 6503.".
- 2007299156 issued "2007".
- 2007299156 issued "c2007.".
- 2007299156 language "eng".
- 2007299156 publisher "Bellingham, Wash. : SPIE,".
- 2007299156 subject "670.42/5 22".
- 2007299156 subject "Computer vision Industrial applications Congresses.".
- 2007299156 subject "Engineering inspection Automation Congresses.".
- 2007299156 subject "Measurement Congresses.".
- 2007299156 subject "Quality control Optical methods Automation Congresses.".
- 2007299156 subject "TS156.2 .M32584 2007".
- 2007299156 title "Machine vision applications in industrial inspection XV : 29-30 January, 2007, San Jose, California, USA / Fabrice Meriaudeau, Kurt S. Niel, editors ; sponsored by IS&T--the Society for Imaging Science and Technology [and] SPIE--the International Society for Optical Engineering.".
- 2007299156 type "text".