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- 2007427206 contributor B10951963.
- 2007427206 created "2007.".
- 2007427206 date "2007".
- 2007427206 date "2007.".
- 2007427206 dateCopyrighted "2007.".
- 2007427206 extent "xi, 143 p. :".
- 2007427206 identifier "3866281242".
- 2007427206 identifier 2007427206.html.
- 2007427206 isPartOf "Series in microelectronics, 0936-5362 ; v. 180".
- 2007427206 issued "2007".
- 2007427206 issued "2007.".
- 2007427206 language "Abstract also in Italian.".
- 2007427206 language "eng ita".
- 2007427206 language "eng".
- 2007427206 publisher "Konstanz : Hartung-Gorre,".
- 2007427206 subject "QC611.8.W53 B89 2007".
- 2007427206 subject "Semiconductor doping.".
- 2007427206 subject "Silicon carbide.".
- 2007427206 subject "Wide gap semiconductors.".
- 2007427206 title "Dopant imaging and profiling of wide bandgap semiconductor devices / Marco Buzzo.".
- 2007427206 type "text".