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- 2007925167 contributor B11057677.
- 2007925167 created "c2007".
- 2007925167 date "2007".
- 2007925167 date "c2007".
- 2007925167 dateCopyrighted "c2007".
- 2007925167 description "Includes bibliographical references (p. [217]-220) and index.".
- 2007925167 extent "xii, 223 p. :".
- 2007925167 identifier "0387717536 (hdbk. : acid-free paper)".
- 2007925167 identifier "9780387717531 (hdbk. : acid-free paper)".
- 2007925167 identifier 2007925167-d.html.
- 2007925167 identifier 2007925167-t.html.
- 2007925167 isPartOf "Lecture notes in electrical engineering ; 2".
- 2007925167 isPartOf "Lecture notes in electrical engineering ; v. 2.".
- 2007925167 issued "2007".
- 2007925167 issued "c2007".
- 2007925167 language "eng".
- 2007925167 publisher "Berlin : Springer,".
- 2007925167 subject "Defect correction methods (Numerical analysis)".
- 2007925167 subject "Electronic noise Mathematical models.".
- 2007925167 subject "Information storage and retrieval systems Materials Defects.".
- 2007925167 subject "Signal detection.".
- 2007925167 subject "TK7867.5 .A45 2007".
- 2007925167 title "Digital noise monitoring of defect origin / Telman Aliev.".
- 2007925167 type "text".