Matches in Library of Congress for { <http://lccn.loc.gov/2007938282> ?p ?o. }
Showing items 1 to 21 of
21
with 100 items per page.
- 2007938282 contributor B11066897.
- 2007938282 contributor B11066898.
- 2007938282 created "c2008.".
- 2007938282 date "2008".
- 2007938282 date "c2008.".
- 2007938282 dateCopyrighted "c2008.".
- 2007938282 description "Includes bibliographical references and index.".
- 2007938282 extent "xvii, 281 p. :".
- 2007938282 identifier "0387764860 (hdbk. : acid-free paper)".
- 2007938282 identifier "9780387764863 (hdbk. : acid-free paper)".
- 2007938282 issued "2008".
- 2007938282 issued "c2008.".
- 2007938282 language "eng".
- 2007938282 publisher "New York, NY : Springer,".
- 2007938282 subject "621.381548 22".
- 2007938282 subject "Integrated circuits Testing.".
- 2007938282 subject "Integrated circuits Very large scale integration.".
- 2007938282 subject "Nanotechnology.".
- 2007938282 subject "TK7874 .T432 2008".
- 2007938282 title "Nanometer technology designs : high-quality delay tests / Mohammad Tehranipoor, Nisar Ahmed.".
- 2007938282 type "text".