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- 2008018722 contributor B11093339.
- 2008018722 created "c2009.".
- 2008018722 date "2009".
- 2008018722 date "c2009.".
- 2008018722 dateCopyrighted "c2009.".
- 2008018722 description "Includes bibliographical references and index.".
- 2008018722 extent "xvi, 753 p. :".
- 2008018722 identifier "9781420043761 (alk. paper)".
- 2008018722 identifier 2008018722.html.
- 2008018722 issued "2009".
- 2008018722 issued "c2009.".
- 2008018722 language "eng".
- 2008018722 publisher "Boca Raton : CRC Press,".
- 2008018722 subject "621.381 22".
- 2008018722 subject "Integrated circuits Defects.".
- 2008018722 subject "Metal oxide semiconductor field-effect transistors Testing.".
- 2008018722 subject "Microelectronics Materials Testing.".
- 2008018722 subject "TK7871 .D44 2009".
- 2008018722 title "Defects in microelectronic materials and devices / edited by Daniel M. Fleetwood, Sokrates T. Pantelides, Ronald D. Schrimpf.".
- 2008018722 type "text".