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- 2008270100 contributor B11139211.
- 2008270100 contributor B11139212.
- 2008270100 created "c2006.".
- 2008270100 date "2006".
- 2008270100 date "c2006.".
- 2008270100 dateCopyrighted "c2006.".
- 2008270100 description "Includes bibliographical references and index.".
- 2008270100 extent "vi, 230 p. :".
- 2008270100 identifier "1424402964 (pbk.)".
- 2008270100 issued "2006".
- 2008270100 issued "c2006.".
- 2008270100 language "eng".
- 2008270100 publisher "Piscataway, NJ : Electron Devices Society ; Reliability Society of the Institute of Electrical and Electronics Engineers,".
- 2008270100 subject "621.3815 22".
- 2008270100 subject "Integrated circuits Reliability Congresses.".
- 2008270100 subject "Integrated circuits Wafer-scale integration Reliability Congresses.".
- 2008270100 subject "TK7874 .I4735 2006".
- 2008270100 title "2006 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Conference Center, S. Lake Tahoe, California, October 16-19, 2006 / sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society.".
- 2008270100 type "text".