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- 2008272693 contributor B11141869.
- 2008272693 contributor B11141870.
- 2008272693 created "c2007.".
- 2008272693 date "2007".
- 2008272693 date "c2007.".
- 2008272693 dateCopyrighted "c2007.".
- 2008272693 description "Includes bibliographical references and indexes.".
- 2008272693 extent "ix, 300 p. :".
- 2008272693 identifier "3908451299 (pbk.)".
- 2008272693 identifier "9783908451297 (pbk.)".
- 2008272693 identifier 2008272693.html.
- 2008272693 isPartOf "Diffusion and defect data. Pt. B, Solid state phenomena, 1012-0394 ; v. 120".
- 2008272693 issued "2007".
- 2008272693 issued "c2007.".
- 2008272693 language "eng".
- 2008272693 publisher "Switzerland : Trans Tech Publications Ltd.,".
- 2008272693 subject "624.171 22".
- 2008272693 subject "Safety".
- 2008272693 subject "Structural analysis (Engineering) Congresses.".
- 2008272693 subject "Structural engineering Research Congresses.".
- 2008272693 subject "Structural integrity".
- 2008272693 subject "Structural stability Congresses.".
- 2008272693 subject "TA645 .I588 2005".
- 2008272693 title "Safety and structural integrity 2006 / edited by Young-Jin Kim.".
- 2008272693 type "text".