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- 2008298667 contributor B11152397.
- 2008298667 created "c2008.".
- 2008298667 date "2008".
- 2008298667 date "c2008.".
- 2008298667 dateCopyrighted "c2008.".
- 2008298667 description "Includes bibliographical references (p. 291-315) and index.".
- 2008298667 description "Introduction -- Terrestrial neutron spectrometry and dosimetry -- Irradiation testing in the terrestrial field -- Neutron irradiation test facilities -- Review and discussion of experimental data -- Monte Carlo simulation methods -- Simulation results and their implications -- International standardization of the neutron test method -- Summary and challenges.".
- 2008298667 extent "xxii, 343 p. :".
- 2008298667 identifier "9789812778819".
- 2008298667 identifier "9812778810".
- 2008298667 issued "2008".
- 2008298667 issued "c2008.".
- 2008298667 language "eng".
- 2008298667 publisher "Hackensack, NJ : World Scientific,".
- 2008298667 subject "621.39/732 22".
- 2008298667 subject "Neutron irradiation.".
- 2008298667 subject "Nuclear physics.".
- 2008298667 subject "Radiation dosimetry.".
- 2008298667 subject "Semiconductor storage devices.".
- 2008298667 subject "TK7895.M4 T455 2008".
- 2008298667 tableOfContents "Introduction -- Terrestrial neutron spectrometry and dosimetry -- Irradiation testing in the terrestrial field -- Neutron irradiation test facilities -- Review and discussion of experimental data -- Monte Carlo simulation methods -- Simulation results and their implications -- International standardization of the neutron test method -- Summary and challenges.".
- 2008298667 title "Terrestrial neutron-induced soft errors in advanced memory devices / Takashi Nakamura ... [et al.].".
- 2008298667 type "text".