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- 2008938171 contributor B11388201.
- 2008938171 created "c2009.".
- 2008938171 date "2009".
- 2008938171 date "c2009.".
- 2008938171 dateCopyrighted "c2009.".
- 2008938171 description "Includes bibliographical references and index.".
- 2008938171 extent "xvii, 489 p. :".
- 2008938171 identifier "0817645926 (pbk.)".
- 2008938171 identifier "9780817645922 (pbk.)".
- 2008938171 isPartOf "Modeling and simulation in science, engineering & technology.".
- 2008938171 isPartOf "Modeling and simulation in science, engineering and technology".
- 2008938171 issued "2009".
- 2008938171 issued "c2009.".
- 2008938171 language "eng".
- 2008938171 publisher "Boston, Mass. : Birkhäuser,".
- 2008938171 subject "530.8 22".
- 2008938171 subject "Datenanalyse Metrologie Statistisches Modell. swd".
- 2008938171 subject "Measurement.".
- 2008938171 subject "Metrologie Datenanalyse Statistisches Modell. swd".
- 2008938171 subject "Metrology.".
- 2008938171 subject "QA465 .D26 2009".
- 2008938171 subject "Statistisches Modell Datenanalyse Metrologie. swd".
- 2008938171 title "Data modeling for metrology and testing in measurement science / Franco Pavese, Alistair B. Forbes, editors.".
- 2008938171 type "text".