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- 2009281699 contributor B11465113.
- 2009281699 contributor B11465114.
- 2009281699 created "c2007.".
- 2009281699 date "2007".
- 2009281699 date "c2007.".
- 2009281699 dateCopyrighted "c2007.".
- 2009281699 description "Includes bibliographical references and author index.".
- 2009281699 extent "1 v. (various pagings) :".
- 2009281699 identifier "0819468525".
- 2009281699 identifier "9780819468529".
- 2009281699 isPartOf "Proceedings of SPIE ; v. 6704".
- 2009281699 isPartOf "Proceedings of SPIE--the International Society for Optical Engineering ; v. 6704.".
- 2009281699 issued "2007".
- 2009281699 issued "c2007.".
- 2009281699 language "eng".
- 2009281699 publisher "Bellingham, Wash. : SPIE,".
- 2009281699 subject "681/.25 22".
- 2009281699 subject "Laser interferometers Congresses.".
- 2009281699 subject "Measurement Congresses.".
- 2009281699 subject "Measuring instruments Design and construction Congresses.".
- 2009281699 subject "Optical instruments Design and construction Congresses.".
- 2009281699 subject "Optical measurements Congresses.".
- 2009281699 subject "QC367 .A335 2007".
- 2009281699 title "Advances in metrology for X-ray and EUV optics II : 30 August 2007, San Diego, California, USA / Lahsen Assoufid, Peter Z. Takacs, Masaru Ohtsuka, editors ; sponsored and published by SPIE.".
- 2009281699 type "text".