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- 2009286019 alternative "13th IEEE European Test Symposium".
- 2009286019 alternative "ETS 2008".
- 2009286019 alternative "European Test Symposium".
- 2009286019 alternative "Proceedings of the 13th IEEE European Test Symposium".
- 2009286019 alternative "Thirteenth IEEE European Test Symposium".
- 2009286019 contributor B11468095.
- 2009286019 contributor B11468096.
- 2009286019 created "c2008.".
- 2009286019 date "2008".
- 2009286019 date "c2008.".
- 2009286019 dateCopyrighted "c2008.".
- 2009286019 description "Includes bibliographical references and index.".
- 2009286019 extent "xvii, 205 p. :".
- 2009286019 identifier "0769531504".
- 2009286019 identifier "9780769531502".
- 2009286019 identifier 2009286019.html.
- 2009286019 issued "2008".
- 2009286019 issued "c2008.".
- 2009286019 language "eng".
- 2009286019 publisher "Los Alamitos, Calif. : Conference Pub. Services : IEEE Computer Society,".
- 2009286019 subject "Integrated circuits Testing Congresses.".
- 2009286019 subject "TK7874 .E7957 2008".
- 2009286019 title "13th IEEE European Test Symposium".
- 2009286019 title "ETS 2008".
- 2009286019 title "European Test Symposium".
- 2009286019 title "Proceedings : Thirteenth IEEE European Test Symposium : ETS 2008, 25-29 May 2008, Verbania, Italy.".
- 2009286019 title "Proceedings of the 13th IEEE European Test Symposium".
- 2009286019 title "Thirteenth IEEE European Test Symposium".
- 2009286019 type "text".