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- 2009419169 contributor B11590603.
- 2009419169 contributor B11590604.
- 2009419169 contributor B11590602.
- 2009419169 created "c2007.".
- 2009419169 date "2007".
- 2009419169 date "c2007.".
- 2009419169 dateCopyrighted "c2007.".
- 2009419169 description "Includes bibliographical references and indexes.".
- 2009419169 extent "xiv, 338 p. :".
- 2009419169 identifier "1558999507".
- 2009419169 identifier "9781558999503".
- 2009419169 identifier 2009419169-d.html.
- 2009419169 isPartOf "Materials Research Society symposia proceedings ; v. 990.".
- 2009419169 isPartOf "Materials Research Society symposium proceedings, 1067-9995 ; v. 990".
- 2009419169 issued "2007".
- 2009419169 issued "c2007.".
- 2009419169 language "eng".
- 2009419169 publisher "Warrendale, Penn. : Materials Research Society,".
- 2009419169 subject "621.3815 22".
- 2009419169 subject "Integrated circuits Very large scale integration Congresses.".
- 2009419169 subject "Interconnects (Integrated circuit technology) Congresses.".
- 2009419169 subject "Materials Congresses.".
- 2009419169 subject "Microelectronics Congresses.".
- 2009419169 subject "Nanoelectronics Congresses.".
- 2009419169 subject "TK7874.53 .S96 2007".
- 2009419169 title "Materials, processes, integration and reliability in advanced interconnects for micro- and nanoelectronics : symposium held April 10-12, 2007, San Francisco, California, U.S.A. / editors: Qinghuang Lin ... [et al.].".
- 2009419169 type "text".