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- 2009920955 contributor B11721050.
- 2009920955 created "c2009.".
- 2009920955 date "2009".
- 2009920955 date "c2009.".
- 2009920955 dateCopyrighted "c2009.".
- 2009920955 description "Includes bibliographical references and index.".
- 2009920955 extent "xxii, 403 p. :".
- 2009920955 format "application/pdf".
- 2009920955 identifier "9780387881355 (alk. paper)".
- 2009920955 identifier F?func=service&doc_library=BVB01&doc_number=018639269&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA.
- 2009920955 identifier bsz302803726inh.htm.
- 2009920955 identifier bsz302803726kap.htm.
- 2009920955 issued "2009".
- 2009920955 issued "c2009.".
- 2009920955 language "eng".
- 2009920955 publisher "New York : Springer,".
- 2009920955 subject "Crystallography.".
- 2009920955 subject "Elektronenbeugung. swd".
- 2009920955 subject "Kristallographie. swd".
- 2009920955 subject "Materials Microscopy.".
- 2009920955 subject "Rückstreuung. swd".
- 2009920955 subject "Scanning electron microscopy.".
- 2009920955 subject "TA417.23 .E419 2009".
- 2009920955 title "Electron backscatter diffraction in materials science / Adam J. Schwartz ... [et al.], eds.".
- 2009920955 type "text".