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- 2009935341 contributor B11730489.
- 2009935341 created "c2010.".
- 2009935341 date "2010".
- 2009935341 date "c2010.".
- 2009935341 dateCopyrighted "c2010.".
- 2009935341 description "Includes bibliographical references and index.".
- 2009935341 extent "xv, 171 p. :".
- 2009935341 identifier "1441909370 (hbk.)".
- 2009935341 identifier "1441909389 (ebk.)".
- 2009935341 identifier "9781441909374 (hbk.)".
- 2009935341 identifier "9781441909381 (ebk.)".
- 2009935341 issued "2010".
- 2009935341 issued "c2010.".
- 2009935341 language "eng".
- 2009935341 publisher "New York : Springer,".
- 2009935341 subject "621.3973 22".
- 2009935341 subject "Random access memory Testing.".
- 2009935341 subject "TK7895.M4 A3185 2010".
- 2009935341 title "Advanced test methods for SRAMs : effective solutions for dynamic fault detection in nanoscaled technologies / by Alberto Bosio ... [et al.].".
- 2009935341 type "text".