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- 2009937220 contributor B11731642.
- 2009937220 contributor B11731643.
- 2009937220 created "2010.".
- 2009937220 date "2010".
- 2009937220 date "2010.".
- 2009937220 dateCopyrighted "2010.".
- 2009937220 description "Includes bibliographical references (p. 95-98).".
- 2009937220 extent "xi, 98 p. :".
- 2009937220 identifier "9048134420 (alk. paper)".
- 2009937220 identifier "9048134439 (e-ISBN)".
- 2009937220 identifier "9789048134427 (alk. paper)".
- 2009937220 identifier "9789048134434 (e-ISBN)".
- 2009937220 isPartOf "Lecture notes in electrical engineering ; v. 51.".
- 2009937220 isPartOf "Lecture notes in electrical engineering, 1876-1100 ; 51".
- 2009937220 issued "2010".
- 2009937220 issued "2010.".
- 2009937220 language "eng".
- 2009937220 publisher "Dordrecht ; New York : Springer,".
- 2009937220 subject "621.381548 22".
- 2009937220 subject "TK7874.7 .H66 2010".
- 2009937220 subject "Very high speed integrated circuits Testing.".
- 2009937220 title "Efficient test methodologies for high-speed serial links / Dongwoo Hong, Kwang-Ting Cheng.".
- 2009937220 type "text".