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- 2010031072 contributor B11773878.
- 2010031072 created "c2011.".
- 2010031072 date "2011".
- 2010031072 date "c2011.".
- 2010031072 dateCopyrighted "c2011.".
- 2010031072 description "Includes bibliographical references and index".
- 2010031072 extent "x, 598 p. :".
- 2010031072 identifier "9780470250020 (hardback)".
- 2010031072 issued "2011".
- 2010031072 issued "c2011.".
- 2010031072 language "eng".
- 2010031072 publisher "Hoboken, N.J. : Wiley,".
- 2010031072 subject "621.382 22".
- 2010031072 subject "Electronic apparatus and appliances Reliability.".
- 2010031072 subject "Fault tolerance (Engineering)".
- 2010031072 subject "Microstructure.".
- 2010031072 subject "Optoelectronic devices Reliability.".
- 2010031072 subject "Structural dynamics.".
- 2010031072 subject "TK7870.23 .S77 2011".
- 2010031072 title "Structural dynamics of electronic and photonic systems / edited by Ephraim Suhir, David S. Steinberg, T.X. Yu.".
- 2010031072 type "text".