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- 2010275443 alternative "27th IEEE VLSI Test Symposium".
- 2010275443 alternative "VLSI Test Symposium".
- 2010275443 alternative "VTS2009".
- 2010275443 contributor B11802779.
- 2010275443 contributor B11802780.
- 2010275443 created "c2009.".
- 2010275443 date "2009".
- 2010275443 date "c2009.".
- 2010275443 dateCopyrighted "c2009.".
- 2010275443 description "Includes bibliographical references and author index.".
- 2010275443 extent "xxvii, 341 p. :".
- 2010275443 identifier "0769535984".
- 2010275443 identifier "9780769535982".
- 2010275443 issued "2009".
- 2010275443 issued "c2009.".
- 2010275443 language "eng".
- 2010275443 publisher "Los Alamitos, Calif. : IEEE Computer Society,".
- 2010275443 subject "621.39/5 22".
- 2010275443 subject "Integrated circuits Very large scale integration Testing Congresses.".
- 2010275443 subject "TK7874 .I32745 2009".
- 2010275443 title "2009 27th IEEE VLSI Test Symposium : proceedings : 3-7 May 2009 Santa Cruz, CA, USA ; VTS 2009 / [sponsored by] IEEE Computer Society.".
- 2010275443 title "27th IEEE VLSI Test Symposium".
- 2010275443 title "VLSI Test Symposium".
- 2010275443 title "VTS2009".
- 2010275443 type "text".