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- 2010286670 contributor B11814017.
- 2010286670 contributor B11814018.
- 2010286670 created "c2008.".
- 2010286670 date "2008".
- 2010286670 date "c2008.".
- 2010286670 dateCopyrighted "c2008.".
- 2010286670 description "Includes bibliographical references and author index.".
- 2010286670 extent "1 v. (various pagings) :".
- 2010286670 identifier "0819472867".
- 2010286670 identifier "9780819472861".
- 2010286670 isPartOf "Proceedings of SPIE, 0277-786X ; v. 7066".
- 2010286670 isPartOf "Proceedings of SPIE--the International Society for Optical Engineering ; v. 7066.".
- 2010286670 issued "2008".
- 2010286670 issued "c2008.".
- 2010286670 language "eng".
- 2010286670 publisher "Bellingham, Wash. : SPIE,".
- 2010286670 subject "681/.25 22".
- 2010286670 subject "Computer vision Congresses.".
- 2010286670 subject "Imaging systems Congresses.".
- 2010286670 subject "Metrology Congresses.".
- 2010286670 subject "Optical measurements Congresses.".
- 2010286670 subject "Quality control Optical methods Congresses.".
- 2010286670 subject "TA1632 .T89 2008".
- 2010286670 subject "Three-dimensional display systems Congresses.".
- 2010286670 title "Two- and three-dimensional methods for inspection and metrology VI : 10-11 August 2008, San Diego, California, USA / Peisen S. Huang, Toru Yoshizawa, Kevin G. Harding, editors ; sponsored and published by by SPIE.".
- 2010286670 type "text".