Matches in Library of Congress for { <http://lccn.loc.gov/2010287640> ?p ?o. }
Showing items 1 to 23 of
23
with 100 items per page.
- 2010287640 contributor B11815223.
- 2010287640 contributor B11815224.
- 2010287640 created "c2009.".
- 2010287640 date "2009".
- 2010287640 date "c2009.".
- 2010287640 dateCopyrighted "c2009.".
- 2010287640 description "Includes bibliographical references.".
- 2010287640 extent "1 v. (various pagings) :".
- 2010287640 identifier "0819474525".
- 2010287640 identifier "9780819474520".
- 2010287640 isPartOf "Proceedings of SPIE, 0277-786X ; v. 7206".
- 2010287640 isPartOf "Proceedings of SPIE--the International Society for Optical Engineering ; v. 7206.".
- 2010287640 issued "2009".
- 2010287640 issued "c2009.".
- 2010287640 language "eng".
- 2010287640 publisher "Bellingham, Wash. : SPIE,".
- 2010287640 subject "621.381 22".
- 2010287640 subject "Microelectromechanical systems Reliability Congresses.".
- 2010287640 subject "Microelectromechanical systems Testing Congresses.".
- 2010287640 subject "Microelectronic packaging Congresses.".
- 2010287640 subject "TK7875 .R438 2009".
- 2010287640 title "Reliability, packaging, testing, and characterization of MEMS/MOEMS and nanodevices VIII : 28-29 January 2009, San Jose, California, United States / Richard C. Kullberg, Rajeshuni Ramesham, editors ; sponsored [and] published by SPIE ; symposium cosponsors, Texas Instruments Inc. (United States) ... [et al.].".
- 2010287640 type "text".