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- 2010287783 alternative "Techniques and analysis".
- 2010287783 contributor B11815426.
- 2010287783 contributor B11815427.
- 2010287783 created "c2008.".
- 2010287783 date "2008".
- 2010287783 date "c2008.".
- 2010287783 dateCopyrighted "c2008.".
- 2010287783 description "Includes bibliographical references and author index.".
- 2010287783 extent "1 v. (various pagings) :".
- 2010287783 identifier "0819472832 (pbk.)".
- 2010287783 identifier "9780819472830 (pbk.)".
- 2010287783 isPartOf "Proceedings of SPIE, 0277-786X ; v. 7063".
- 2010287783 isPartOf "Proceedings of SPIE--the International Society for Optical Engineering ; v. 7063.".
- 2010287783 issued "2008".
- 2010287783 issued "c2008.".
- 2010287783 language "eng".
- 2010287783 publisher "Bellingham, Wash. : SPIE,".
- 2010287783 subject "Interferometry Methodology Congresses.".
- 2010287783 subject "Measurement Congresses.".
- 2010287783 subject "Metrology Congresses.".
- 2010287783 subject "QC410.9 .I5682 2008".
- 2010287783 title "Interferometry XIV. Techniques and analysis : 11-13 August 2008, San Diego, California, USA / Joanna Schmit, Katherine Creath, Catherine E. Towers, editors ; sponsored and published by SPIE.".
- 2010287783 title "Techniques and analysis".
- 2010287783 type "text".