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- 2010287904 contributor B11815620.
- 2010287904 contributor B11815621.
- 2010287904 contributor B11815622.
- 2010287904 created "c2007.".
- 2010287904 date "2007".
- 2010287904 date "c2007.".
- 2010287904 dateCopyrighted "c2007.".
- 2010287904 description "Includes bibliographical references and index.".
- 2010287904 extent "3 v. (various pagings) :".
- 2010287904 identifier "9780819468802".
- 2010287904 isPartOf "Proceedings of SPIE, 0277-786X ; v. 6723".
- 2010287904 issued "2007".
- 2010287904 issued "c2007.".
- 2010287904 language "eng".
- 2010287904 publisher "Bellingham, Wash. : SPIE,".
- 2010287904 subject "621.36 23".
- 2010287904 subject "Measurement Congresses.".
- 2010287904 subject "Optical materials Testing Congresses.".
- 2010287904 subject "Optical measurements Congresses.".
- 2010287904 subject "QC374 .I59 2007".
- 2010287904 title "Optical test and measurement technology and equipment : 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies : 8-12 July 2007, Chengdu, China / Junhua Pan, James C. Wyant, Hexin Wang, editors ; sponsored by COS--the Chinese Optical Society (China), IOE--the Institute of Optics and Electronics, CAS (China) ; technical cosponsor, SPIE ; cosponsoring organizations, State Key Laboratory of Optical Technology for Microfabrication (China), SOS--Sichuan Optical Society (China) ; cooperating organization, Committee of Optical Manufacturing Technology, COS (China) ; supporting organizations, Ministry of Science and Technology of China (China), Chinese Academy of Sciences (China), National Natural Science Foundation of China (China) ; published by SPIE.".
- 2010287904 type "text".