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- 2010287972 contributor B11815766.
- 2010287972 contributor B11815767.
- 2010287972 created "c2007.".
- 2010287972 date "2007".
- 2010287972 date "c2007.".
- 2010287972 dateCopyrighted "c2007.".
- 2010287972 description "Includes bibliographical references and index.".
- 2010287972 extent "1 v. (various pagings) :".
- 2010287972 identifier "0819468207".
- 2010287972 identifier "9780819468208".
- 2010287972 isPartOf "Proceedings of SPIE ; v. 6672".
- 2010287972 isPartOf "Proceedings of SPIE--the International Society for Optical Engineering ; v. 6672.".
- 2010287972 issued "2007".
- 2010287972 issued "c2007.".
- 2010287972 language "eng".
- 2010287972 publisher "Bellingham, Wash. : SPIE,".
- 2010287972 subject "Nanotechnology Congresses.".
- 2010287972 subject "Optical measurements Congresses.".
- 2010287972 subject "Optoelectronic devices Congresses.".
- 2010287972 subject "Optoelectronics Congresses.".
- 2010287972 subject "Semiconductors Characterization Congresses.".
- 2010287972 subject "TA1750 .A333 2007".
- 2010287972 subject "Thin films Optical properties Congresses.".
- 2010287972 title "Advanced characterization techniques for optics, semiconductors, and nanotechnologies III : 28-29 August 2007, San Diego, California, USA / Angela Duparré, Bhanwar Singh, Zu-Han Gu, editors ; sponsored and published by SPIE.".
- 2010287972 type "text".