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- 2010455090 abstract "Wafer-level testing refers to a critical process of subjecting integrated circuits and semiconductor devices to electrical testing while they are still in wafer form. Burn-in is a temperature/bias reliability stress test used in detecting and screening out potential early life device failures. This hands-on resource provides a comprehensive analysis of these methods, showing how wafer-level testing during burn-in (WLTBI) helps lower product cost in semiconductor manufacturing. Engineers learn how to implement the testing of integrated circuits at the wafer-level under various resource constraints. Moreover, this book helps practitioners address the issue of enabling next generation products with previous generation testers. Practitioners also find expert insights on current industry trends in WLTBI test solutions.".
- 2010455090 contributor B11960626.
- 2010455090 contributor B11960627.
- 2010455090 created "c2010.".
- 2010455090 date "2010".
- 2010455090 date "c2010.".
- 2010455090 dateCopyrighted "c2010.".
- 2010455090 description "Includes bibliographical references and index.".
- 2010455090 description "Wafer-level testing refers to a critical process of subjecting integrated circuits and semiconductor devices to electrical testing while they are still in wafer form. Burn-in is a temperature/bias reliability stress test used in detecting and screening out potential early life device failures. This hands-on resource provides a comprehensive analysis of these methods, showing how wafer-level testing during burn-in (WLTBI) helps lower product cost in semiconductor manufacturing. Engineers learn how to implement the testing of integrated circuits at the wafer-level under various resource constraints. Moreover, this book helps practitioners address the issue of enabling next generation products with previous generation testers. Practitioners also find expert insights on current industry trends in WLTBI test solutions.".
- 2010455090 extent "xv, 198 p. :".
- 2010455090 identifier "1596939893".
- 2010455090 identifier "9781596939899".
- 2010455090 isPartOf "Artech House integrated microsystems series".
- 2010455090 issued "2010".
- 2010455090 issued "c2010.".
- 2010455090 language "eng".
- 2010455090 publisher "Boston : Artech House,".
- 2010455090 subject "621.3815/48 22".
- 2010455090 subject "Integrated circuits Testing.".
- 2010455090 subject "Integrated circuits Wafer-scale integration.".
- 2010455090 subject "Semiconductors Testing.".
- 2010455090 subject "TK7874 .B327 2010".
- 2010455090 title "Wafer-level testing and test during burn-in for integrated circuits / Sudarshan Bahukudumbi, Krishnendu Chakrabarty.".
- 2010455090 type "text".