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- 2010455186 contributor B11960729.
- 2010455186 contributor B11960730.
- 2010455186 created "c2008.".
- 2010455186 date "2008".
- 2010455186 date "c2008.".
- 2010455186 dateCopyrighted "c2008.".
- 2010455186 description "Includes bibliographical references and index.".
- 2010455186 extent "1 v. (various pagings) :".
- 2010455186 identifier "081947262X".
- 2010455186 identifier "9780819472625".
- 2010455186 isPartOf "Proceedings of SPIE, 0277-786X ; v. 7042".
- 2010455186 isPartOf "Proceedings of SPIE--the International Society for Optical Engineering ; v. 7042.".
- 2010455186 issued "2008".
- 2010455186 issued "c2008.".
- 2010455186 language "eng".
- 2010455186 publisher "Bellingham, Wash. : SPIE,".
- 2010455186 subject "620/.5 22".
- 2010455186 subject "Microfabrication Congresses.".
- 2010455186 subject "Nanomanufacturing Congresses.".
- 2010455186 subject "Nanostructured materials Congresses.".
- 2010455186 subject "TA418.9.N35 I567 2008".
- 2010455186 title "Instrumentation, metrology, and standards for nanomanufacturing II : 10 August 2008, San Diego, California, USA / Michael T. Postek, John A. Allgair, editors ; sponsored and published by SPIE ; cosponsored by NIST--National Institute of Standards and Technology (United States)".
- 2010455186 type "text".