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- 2010455210 alternative "3D imaging metrology".
- 2010455210 contributor B11960781.
- 2010455210 contributor B11960782.
- 2010455210 created "c2009.".
- 2010455210 date "2009".
- 2010455210 date "c2009.".
- 2010455210 dateCopyrighted "c2009.".
- 2010455210 description "Includes bibliographical references and index.".
- 2010455210 extent "1 v. (various pagings). :".
- 2010455210 identifier "0819474894".
- 2010455210 identifier "9780819474896".
- 2010455210 isPartOf "Electronic Imaging Science and Technology Symposium. Proceedings of Electronic Imaging Science and Technology.".
- 2010455210 isPartOf "Proceedings of Electronic Imaging Science and Technology".
- 2010455210 isPartOf "Proceedings of SPIE ; v. 7239".
- 2010455210 isPartOf "Proceedings of SPIE--the International Society for Optical Engineering ; v. 7239.".
- 2010455210 issued "2009".
- 2010455210 issued "c2009.".
- 2010455210 language "eng".
- 2010455210 publisher "Bellingham, Wash., USA : SPIE,".
- 2010455210 subject "621.36/7 22".
- 2010455210 subject "Engineering inspection Congresses.".
- 2010455210 subject "Lasers Congresses.".
- 2010455210 subject "Measurement Congresses.".
- 2010455210 subject "TK8315 .T55 2009".
- 2010455210 subject "Three-dimensional display systems Congresses.".
- 2010455210 subject "Triangulation Congresses.".
- 2010455210 title "3D imaging metrology".
- 2010455210 title "Three-dimensional imaging metrology : 19-20 January 2009, San Jose, California, USA / J. Angelo Beraldin ... [et al.], editors ; sponsored and published by IS&T--The Society for Imaging Science and Technology [and] SPIE.".
- 2010455210 type "text".