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- 2010455694 alternative "Time and frequency metrology 2".
- 2010455694 alternative "Time and frequency metrology two".
- 2010455694 contributor B11961351.
- 2010455694 contributor B11961352.
- 2010455694 created "c2009.".
- 2010455694 date "2009".
- 2010455694 date "c2009.".
- 2010455694 dateCopyrighted "c2009.".
- 2010455694 description "Includes bibliographical references and author index.".
- 2010455694 extent "1 v. (various pagings) :".
- 2010455694 identifier "0819477214".
- 2010455694 identifier "9780819477217".
- 2010455694 isPartOf "Proceedings of SPIE, 0277-786X ; v. 7431".
- 2010455694 isPartOf "Proceedings of SPIE--the International Society for Optical Engineering ; v. 7431.".
- 2010455694 issued "2009".
- 2010455694 issued "c2009.".
- 2010455694 language "eng".
- 2010455694 publisher "Bellingham, Wash. : SPIE,".
- 2010455694 subject "529/.7 22".
- 2010455694 subject "Measurement Congresses.".
- 2010455694 subject "Metrology Congresses.".
- 2010455694 subject "QB213 .T56 2009".
- 2010455694 subject "Time measurements Congresses.".
- 2010455694 title "Time and frequency metrology 2".
- 2010455694 title "Time and frequency metrology II : 5 August 2009, San Diego, California, United States / Tetsuya Ido, Derryck T. Reid, editors ; sponsored and published by SPIE.".
- 2010455694 title "Time and frequency metrology two".
- 2010455694 type "text".