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- 2010459471 contributor B11965501.
- 2010459471 contributor B11965502.
- 2010459471 created "c2010.".
- 2010459471 date "2010".
- 2010459471 date "c2010.".
- 2010459471 dateCopyrighted "c2010.".
- 2010459471 description "Includes bibliographical references and author index.".
- 2010459471 extent "1 v. (various pagings) :".
- 2010459471 identifier "081948217X".
- 2010459471 identifier "9780819482174".
- 2010459471 isPartOf "Proceedings of SPIE, 0277-786X ; v. 7729".
- 2010459471 isPartOf "Proceedings of SPIE--the International Society for Optical Engineering ; v. 7729. 0277-786X".
- 2010459471 issued "2010".
- 2010459471 issued "c2010.".
- 2010459471 language "eng".
- 2010459471 publisher "Bellingham, Wash. : SPIE,".
- 2010459471 subject "570.28/25 23".
- 2010459471 subject "QH212.S3 S345 2010".
- 2010459471 subject "Scanning electron microscopes Congresses.".
- 2010459471 title "Scanning microscopy 2010 : 17-19 May 2010, Monterey, California, United States / Michael T. Postek ... [et al.], editors ; sponsored by SPIE ; technical cosponsor, NIST--National Institute of Standards and Technology (United States).".
- 2010459471 type "text".