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- 2010484146 alternative "Memory Technology, Design, and Testing".
- 2010484146 alternative "Proceedings of the IEEE Workshop on Memory Technology, Design, and Testing".
- 2010484146 contributor B11986429.
- 2010484146 contributor B11986430.
- 2010484146 created "c2009.".
- 2010484146 date "2009".
- 2010484146 date "c2009.".
- 2010484146 dateCopyrighted "c2009.".
- 2010484146 description "Includes bibliographical references and index.".
- 2010484146 extent "xxii, 95 p. :".
- 2010484146 identifier "0769537979 (pbk.)".
- 2010484146 identifier "9780769537979 (pbk.)".
- 2010484146 issued "2009".
- 2010484146 issued "c2009.".
- 2010484146 language "eng".
- 2010484146 publisher "Los Alamitos, Calif. : IEEE Computer Society,".
- 2010484146 subject "004.568 23".
- 2010484146 subject "Random access memory Congresses.".
- 2010484146 subject "Semiconductor storage devices Testing Congresses.".
- 2010484146 subject "TK7895.M4 I334 2009".
- 2010484146 title "MTDT 2009 : 2009 IEEE International Workshop on Memory Technology, Design, and Testing : proceedings, 31 August- 2 September 2009, Hsinchu, Taiwan.".
- 2010484146 title "Memory Technology, Design, and Testing".
- 2010484146 title "Proceedings of the IEEE Workshop on Memory Technology, Design, and Testing".
- 2010484146 type "text".