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- 2010490876 contributor B11992837.
- 2010490876 created "2009.".
- 2010490876 date "2009".
- 2010490876 date "2009.".
- 2010490876 dateCopyrighted "2009.".
- 2010490876 description "Includes bibliographical references (p. [263]-340).".
- 2010490876 extent "340 p. :".
- 2010490876 identifier "9788371438066".
- 2010490876 isPartOf "Rozprawy / Politechnika Poznańska, 0551-6528 ; nr 429".
- 2010490876 issued "2009".
- 2010490876 issued "2009.".
- 2010490876 language "Summary in English.".
- 2010490876 language "pol eng".
- 2010490876 language "pol".
- 2010490876 publisher "Poznań : Wydawn. Politechniki Poznańskiej,".
- 2010490876 subject "Surface roughness Measurement.".
- 2010490876 subject "Surfaces (Technology) Analysis.".
- 2010490876 subject "TA418.7 .W54 2009".
- 2010490876 title "Wykorzystanie analizy topograficznej w pomiarach nierówności powierzchni / Michał Wieczorowski.".
- 2010490876 type "text".