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- 2010935580 contributor B12094632.
- 2010935580 contributor B12094633.
- 2010935580 created "c2011.".
- 2010935580 date "2011".
- 2010935580 date "c2011.".
- 2010935580 dateCopyrighted "c2011.".
- 2010935580 description "Includes bibliographical references and index.".
- 2010935580 description "Lifetime Prediction -- Failure Modes and Mechanisms: Failure Modes and Mechanisms in MEMS -- In-Use Failures -- Root Cause and Failure Analysis -- Testing and Standards for Qualification -- Continuous Improvement: Tools and Techniques for Reliability Improvement.".
- 2010935580 extent "xiii, 291 p. :".
- 2010935580 identifier "1441960171 (alk. paper)".
- 2010935580 identifier "144196018X (e-ISBN)".
- 2010935580 identifier "9781441960177 (alk. paper)".
- 2010935580 identifier "9781441960184 (e-ISBN)".
- 2010935580 isPartOf "MEMS reference shelf".
- 2010935580 issued "2011".
- 2010935580 issued "c2011.".
- 2010935580 language "eng".
- 2010935580 publisher "New York : Springer,".
- 2010935580 subject "621.381 22".
- 2010935580 subject "Microelectromechanical systems Reliability.".
- 2010935580 subject "TK7875 .H378 2011".
- 2010935580 tableOfContents "Lifetime Prediction -- Failure Modes and Mechanisms: Failure Modes and Mechanisms in MEMS -- In-Use Failures -- Root Cause and Failure Analysis -- Testing and Standards for Qualification -- Continuous Improvement: Tools and Techniques for Reliability Improvement.".
- 2010935580 title "MEMS reliability / Allyson L. Hartzell, Mark G. da Silva, Herbert R. Shea ; Foreword by Stephen D. Senturia.".
- 2010935580 type "text".