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- 2010935594 contributor B12094644.
- 2010935594 contributor B12094645.
- 2010935594 created "c2010.".
- 2010935594 date "2010".
- 2010935594 date "c2010.".
- 2010935594 dateCopyrighted "c2010.".
- 2010935594 description "Includes bibliographical references (p. 235-244) and index.".
- 2010935594 extent "x, 255 p. :".
- 2010935594 identifier "9783642024160".
- 2010935594 identifier 2010935594-b.html.
- 2010935594 identifier 2010935594-d.html.
- 2010935594 identifier 2010935594-t.html.
- 2010935594 isPartOf "Springer series in advanced microelectronics ; 10".
- 2010935594 issued "2010".
- 2010935594 issued "c2010.".
- 2010935594 language "eng".
- 2010935594 publisher "Heidelberg ; New York : Springer,".
- 2010935594 subject "Electronic apparatus and appliances Testing.".
- 2010935594 subject "Electronic apparatus and appliances Thermal properties.".
- 2010935594 subject "Semiconductors Thermal properties.".
- 2010935594 subject "TK7870.25 .B74 2010".
- 2010935594 subject "Thermography.".
- 2010935594 title "Lock-in thermography : basics and use for evaluating electronic devices and materials / O. Breitenstein, W. Warta, M. Langenkamp.".
- 2010935594 type "text".