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- 2011276516 contributor B12164541.
- 2011276516 created "c2011.".
- 2011276516 date "2011".
- 2011276516 date "c2011.".
- 2011276516 dateCopyrighted "c2011.".
- 2011276516 description "Includes bibliographical references and index.".
- 2011276516 extent "vii, 150 p. :".
- 2011276516 identifier "0857293095 (alk. paper)".
- 2011276516 identifier "9780857293091 (alk. paper)".
- 2011276516 identifier "9780857293107 (e-ISBN)".
- 2011276516 isPartOf "Springer series in reliability engineering".
- 2011276516 isPartOf "Springer series in reliability engineering.".
- 2011276516 issued "2011".
- 2011276516 issued "c2011.".
- 2011276516 language "eng".
- 2011276516 publisher "London ; New York : Springer,".
- 2011276516 subject "621.395 22".
- 2011276516 subject "Finite element method.".
- 2011276516 subject "Integrated circuits Ultra large scale integration.".
- 2011276516 subject "Reliability (Engineering)".
- 2011276516 subject "TK7874.76 .A67 2011".
- 2011276516 title "Applications of finite element methods for reliability studies on ULSI interconnections / Cher Ming Tan ... [et al.].".
- 2011276516 type "text".