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- 2011280775 contributor B12169082.
- 2011280775 created "c2010.".
- 2011280775 date "2010".
- 2011280775 date "c2010.".
- 2011280775 dateCopyrighted "c2010.".
- 2011280775 description "Includes bibliographical references and index.".
- 2011280775 extent "xix, 291 p. :".
- 2011280775 identifier "9789814273329".
- 2011280775 identifier "9814273325".
- 2011280775 isPartOf "International series on advances in solid state electronics and technology".
- 2011280775 isPartOf "International series on advances in solid state electronics and technology.".
- 2011280775 issued "2010".
- 2011280775 issued "c2010.".
- 2011280775 language "eng".
- 2011280775 publisher "Singapore ; Hackensack, NJ : World Scientific,".
- 2011280775 subject "Electrodiffusion.".
- 2011280775 subject "Integrated circuits Ultra large scale integration.".
- 2011280775 subject "TK7874.76 .T36 2010".
- 2011280775 title "Electromigration in ULSI Interconnections / Cher Ming Tan.".
- 2011280775 type "text".