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- 2011281716 contributor B12170134.
- 2011281716 contributor B12170135.
- 2011281716 created "c2011.".
- 2011281716 date "2011".
- 2011281716 date "c2011.".
- 2011281716 dateCopyrighted "c2011.".
- 2011281716 description "Includes bibliographical references and index.".
- 2011281716 extent "ix, 215 p. :".
- 2011281716 identifier "1441979573".
- 2011281716 identifier "9781441979575".
- 2011281716 identifier "9781441979582 (e-ISBN)".
- 2011281716 identifier 2011281716-d.html.
- 2011281716 identifier 2011281716-t.html.
- 2011281716 isPartOf "Integrated circuits and systems, 1558-9412".
- 2011281716 isPartOf "Integrated circuits and systems.".
- 2011281716 issued "2011".
- 2011281716 issued "c2011.".
- 2011281716 language "eng".
- 2011281716 publisher "New York : Springer,".
- 2011281716 subject "Integrated circuits Fault tolerance.".
- 2011281716 subject "Nanoelectronics.".
- 2011281716 subject "Semiconductor storage devices Design and construction.".
- 2011281716 subject "Semiconductor storage devices Maintenance and repair.".
- 2011281716 subject "Semiconductor storage devices Reliability.".
- 2011281716 subject "TK7895.M4 H67 2011".
- 2011281716 title "Nanoscale memory repair / Masashi Horiguchi, Kiyoo Itoh.".
- 2011281716 type "text".