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- 2011286715 alternative "25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems".
- 2011286715 alternative "DFT 2010".
- 2011286715 alternative "Defect and fault tolerance in VLSI systems".
- 2011286715 contributor B12174837.
- 2011286715 contributor B12174838.
- 2011286715 contributor B12174839.
- 2011286715 created "c2010.".
- 2011286715 date "2010".
- 2011286715 date "c2010.".
- 2011286715 dateCopyrighted "c2010.".
- 2011286715 description "Includes bibliographical references and author index.".
- 2011286715 extent "xiv, 449 p. :".
- 2011286715 identifier "0769542433 (pbk.)".
- 2011286715 identifier "9780769542430 (pbk.)".
- 2011286715 issued "2010".
- 2011286715 issued "c2010.".
- 2011286715 language "eng".
- 2011286715 publisher "Los Alamitos, Calif. : IEEE Computer Society Press,".
- 2011286715 subject "Fault-tolerant computing Congresses.".
- 2011286715 subject "Integrated circuits Very large scale integration Design and construction Congresses.".
- 2011286715 subject "TK7874 .I176 2010".
- 2011286715 title "2010 25th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems : DFT 2010 : proceedings, 6-8 October 2010, Kyoto, Kyoto, Japan / sponsored by The IEEE Computer Society Technical Committee on Fault Tolerant Computing, The IEEE Computer Society Test Technology Technical Council ; edited by Glenn Chapman ... [et al.].".
- 2011286715 title "25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems".
- 2011286715 title "DFT 2010".
- 2011286715 title "Defect and fault tolerance in VLSI systems".
- 2011286715 type "text".